Data underlying the publication: In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-Si solar cells

doi:10.4121/19425749.v1
The doi above is for this specific version of this dataset, which is currently the latest. Newer versions may be published in the future. For a link that will always point to the latest version, please use
doi: 10.4121/19425749
Datacite citation style:
Bannenberg, Lars; Morisset, Audrey; Famprikis, Theodosios (2022): Data underlying the publication: In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-Si solar cells. Version 1. 4TU.ResearchData. dataset. https://doi.org/10.4121/19425749.v1
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Dataset
Data corresponding to the publication 'In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-Si solar cells' in ACS Applied Materials and Interfaces. The data are composed of X-ray reflectometry (XRR), Grazing Incidence X-ray diffraction (GIXRD) and lifetime measurements of passivating contacts for c-Si solar cells.
history
  • 2022-03-29 first online, published, posted
publisher
4TU.ResearchData
format
All data is stored as raw data as derived from the machine as well as exported as treated and untreated text files. Please see the file '20220323 Data Description' for more details
funding
  • Surface Lifetime Investigation for Characterization and Enhancement of passivating contacts in c-Si solar cells (grant code 101028491) [more info...] European Commission
  • Swiss Federal Office for Energy (OFEN) within the project iPrecise (SI/502115-699 01)
organizations
Delft University of Technology, Faculty of Applied Sciences;
Ecole Polytechnique Fédérale de Lausanne (EPFL), Photovoltaics and Thin Film Electronics Laboratory

DATA

files (1)