cff-version: 1.2.0
abstract: "Data corresponding to the publication 'In situ reflectometry and 
diffraction investigation of the multiscale structure of p-type 
polysilicon passivating contacts for c-Si solar cells' in ACS Applied 
Materials and Interfaces. The data are composed of X-ray reflectometry (XRR), Grazing Incidence X-ray diffraction (GIXRD) and lifetime measurements of passivating contacts for c-Si solar cells. <br>"
authors:
  - family-names: Bannenberg
    given-names: Lars
    orcid: "https://orcid.org/0000-0001-8150-3694"
  - family-names: Morisset
    given-names: Audrey
    orcid: "https://orcid.org/0000-0003-0878-6725"
  - family-names: Famprikis
    given-names: Theodosios
title: "Data underlying the publication: In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-Si solar cells"
keywords:
version: 1
identifiers:
  - type: doi
    value: 10.4121/19425749.v1
license: CC BY-NC-ND 4.0
date-released: 2022-03-29