%0 Generic
%A Bannenberg, Lars
%A Morisset, Audrey
%A Famprikis, Theodosios
%D 2022
%T Data underlying the publication: In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-Si solar cells
%U https://data.4tu.nl/articles/dataset/Data_underlying_the_publication_In_situ_reflectometry_and_diffraction_investigation_of_the_multiscale_structure_of_p-type_polysilicon_passivating_contacts_for_c-Si_solar_cells/19425749/1
%R 10.4121/19425749.v1
%K c-Si solar cells
%K passivating contacts
%K poly-Si
%K SiOx
%K X-ray reflectometry
%K in situ monitoring
%K annealing
%X Data corresponding to the publication 'In situ reflectometry and 
diffraction investigation of the multiscale structure of p-type 
polysilicon passivating contacts for c-Si solar cells' in ACS Applied 
Materials and Interfaces. The data are composed of X-ray reflectometry (XRR), Grazing Incidence X-ray diffraction (GIXRD) and lifetime measurements of passivating contacts for c-Si solar cells. <br>
%I 4TU.ResearchData