TY - DATA
T1 - Data underlying the publication: In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-Si solar cells
PY - 2022/03/29
AU - Lars Bannenberg
AU - Audrey Morisset
AU - Theodosios Famprikis
UR - https://data.4tu.nl/articles/dataset/Data_underlying_the_publication_In_situ_reflectometry_and_diffraction_investigation_of_the_multiscale_structure_of_p-type_polysilicon_passivating_contacts_for_c-Si_solar_cells/19425749/1
DO - 10.4121/19425749.v1
KW - c-Si solar cells
KW - passivating contacts
KW - poly-Si
KW - SiOx
KW - X-ray reflectometry
KW - in situ monitoring
KW - annealing
N2 - Data corresponding to the publication 'In situ reflectometry and 
diffraction investigation of the multiscale structure of p-type 
polysilicon passivating contacts for c-Si solar cells' in ACS Applied 
Materials and Interfaces. The data are composed of X-ray reflectometry (XRR), Grazing Incidence X-ray diffraction (GIXRD) and lifetime measurements of passivating contacts for c-Si solar cells. <br>
ER -