The doi above is for this specific version of this dataset, which is currently the latest. Newer versions may be published in the future. For a link that will always point to the latest version, please use
doi: 10.4121/c41c26f7-586f-48ca-8abe-9127b2d97c60

Kiene, Gerd; Ilik, Sadik; Mastrodomenico, Luigi; Babaie, Masoud; Sebastiano, Fabio (2024): Data underlying the publication: Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS. Version 1. 4TU.ResearchData. dataset. https://doi.org/10.4121/c41c26f7-586f-48ca-8abe-9127b2d97c60.v1

Dataset

• Mechanical Engineering
• Electrical and Electronic Engineering
• Engineering

1/f noise, CMOS, cryo-CMOS, cryogenic electronics, flicker noise, LFN, Low-frequency noise, Quantum Computing

CC0

RefWorks, BibTeX, Reference Manager, Endnote, DataCite, NLM, DC, CFF

by Gerd Kiene , Sadik Ilik , Luigi Mastrodomenico , Masoud Babaie , Fabio Sebastiano

Data underlying the publication: Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS.

The data concerns cryogenic low-frequency noise characterization of CMOS transistors. A wide range of geometries and bias points are swept. Details on how the data was recorded are found in the associated paper and its supplementary. For using the data, please refer to the "README.txt" file that is part of the data.

• 2024-08-01 first online, published, posted

4TU.ResearchData

.npy, .ipynb, .ppt, .png

Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS

QuTech, Delft University of Technology;
TU Delft, Faculty of Electrical Engineering, Mathematics and Computer Science, Department of Quantum & Computer Engineering