TY - DATA
T1 - Data underlying the publication: Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS
PY - 2024/08/01
AU - Gerd Kiene
AU - Sadik Ilik
AU - Luigi Mastrodomenico
AU - Masoud Babaie
AU - Fabio Sebastiano
UR - 
DO - 10.4121/c41c26f7-586f-48ca-8abe-9127b2d97c60.v1
KW - Low-frequency noise
KW - LFN
KW - 1/f noise
KW - flicker noise
KW - cryo-CMOS
KW - CMOS
KW - Quantum Computing
KW - cryogenic electronics
N2 - <p>Data underlying the publication: Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS.</p><p><br></p><p>The data concerns cryogenic low-frequency noise characterization of CMOS transistors. A wide range of geometries and bias points are swept. Details on how the data was recorded are found in the associated paper and its supplementary. For using the data, please refer to the "README.txt" file that is part of the data.</p>
ER -