The doi above is for this specific version of this dataset, which is currently the latest. Newer versions may be published in the future. For a link that will always point to the latest version, please use
doi: 10.4121/16635193

Marta Saccher; Kawasaki, Shinnosuke; Ronald Dekker (2021): Video recording associated with the publication: The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices. Version 1. 4TU.ResearchData. dataset. https://doi.org/10.4121/16635193.v1

Dataset

• Electrical and Electronic Engineering
• Biomedical Engineering

Capacitive Micromachined Ultrasound Transducers, CMUT, pre-charged CMUTs, ultrasound power transfer

CC0

RefWorks, BibTeX, Reference Manager, Endnote, DataCite, NLM, DC, CFF

by Marta Saccher , Shinnosuke Kawasaki , Ronald Dekker

This dataset contains the video recordings associated with the publication. In the video, one CMUT element is exernally biased with a DC bias source, which is swept between 0 and 130 V and vice-versa. It can be seen that CMUTs go into collapse when the external DC bias voltage is higher than the collapse voltage (multiple rings of interference pattern appears at CMUTs cells, indicating a larger deflection profile). It can also be seen that not all the CMUT cells go into collapse and out-of-collapse at the same time.

• 2021-09-22 first online, published, posted

4TU.ResearchData

.mp4

The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices

• ECSEL JU, under grant agreement H2020-ECSEL-2019-IA-876190

TU Delft, Faculty of Electrical Engineering, Mathematics and Computer Science, Department of Microelectronics