Video recording associated with the publication: The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices
doi: 10.4121/16635193.v1
The doi above is for this specific version of this dataset, which is currently the latest. Newer versions may be published in the future.
For a link that will always point to the latest version, please use
doi: 10.4121/16635193
doi: 10.4121/16635193
Datacite citation style:
Marta Saccher; Kawasaki, Shinnosuke; Ronald Dekker (2021): Video recording associated with the publication: The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices. Version 1. 4TU.ResearchData. dataset. https://doi.org/10.4121/16635193.v1
Other citation styles (APA, Harvard, MLA, Vancouver, Chicago, IEEE) available at Datacite
Dataset
usage stats
922
views
140
downloads
licence
![cc-0.png logo](/static/images/licenses/cc-0.png)
This dataset contains the video recordings associated with the publication. In the video, one CMUT element is exernally biased with a DC bias source, which is swept between 0 and 130 V and vice-versa. It can be seen that CMUTs go into collapse when the external DC bias voltage is higher than the collapse voltage (multiple rings of interference pattern appears at CMUTs cells, indicating a larger deflection profile). It can also be seen that not all the CMUT cells go into collapse and out-of-collapse at the same time.
history
- 2021-09-22 first online, published, posted
publisher
4TU.ResearchData
format
.mp4
associated peer-reviewed publication
The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices
funding
- ECSEL JU, under grant agreement H2020-ECSEL-2019-IA-876190
organizations
TU Delft, Faculty of Electrical Engineering, Mathematics and Computer Science, Department of Microelectronics
DATA
files (1)
-
7,871,033 bytesMD5:
db2c3e2355a2fbce28e17920ac1b1178
CMUT_collapse.mp4 - download all files (zip)
7,871,033 bytes unzipped