cff-version: 1.2.0
abstract: "This dataset contains the video recordings associated with the publication. In the video, one CMUT element is exernally biased with a DC bias source, which is swept between 0 and 130 V and vice-versa. It can be seen that CMUTs go into collapse when the external DC bias voltage is higher than the collapse voltage (multiple rings of interference pattern appears at CMUTs cells, indicating a larger deflection profile). It can also be seen that not all the CMUT cells go into collapse and out-of-collapse at the same time."
authors:
  - family-names: Saccher
    given-names: Marta
    orcid: "https://orcid.org/0000-0002-9509-7815"
  - family-names: Kawasaki
    given-names: Shinnosuke
  - family-names: Dekker
    given-names: Ronald
title: "Video recording associated with the publication: The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices"
keywords:
version: 1
identifiers:
  - type: doi
    value: 10.4121/16635193.v1
license: CC0
date-released: 2021-09-22