%0 Generic
%A Saccher, Marta
%A Kawasaki, Shinnosuke
%A Dekker, Ronald
%D 2021
%T Video recording associated with the publication: The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices
%U https://data.4tu.nl/articles/dataset/Video_recording_associated_with_the_publication_The_long-term_reliability_of_pre-charged_CMUTs_for_the_powering_of_deep_implanted_devices/16635193/1
%R 10.4121/16635193.v1
%K CMUT
%K ultrasound power transfer
%K pre-charged CMUTs
%K Capacitive Micromachined Ultrasound Transducers
%X This dataset contains the video recordings associated with the publication. In the video, one CMUT element is exernally biased with a DC bias source, which is swept between 0 and 130 V and vice-versa. It can be seen that CMUTs go into collapse when the external DC bias voltage is higher than the collapse voltage (multiple rings of interference pattern appears at CMUTs cells, indicating a larger deflection profile). It can also be seen that not all the CMUT cells go into collapse and out-of-collapse at the same time.
%I 4TU.ResearchData