de Jong, Tobias A.; Jobst, J. (Johannes) (2019): Data underlying the paper: Quantitative analysis of spectroscopic Low Energy Electron Microscopy Data. Version 1. 4TU.ResearchData. dataset. https://doi.org/10.4121/uuid:7f672638-66f6-4ec3-a16c-34181cc45202

Dataset

• Condensed Matter Physics

Calibration data, Electron Spectroscopy, Graphene on Silicon Carbide, LEEM-IV, Low Energy Electron Microscopy, Material Science

CC0

RefWorks, BibTeX, Reference Manager, Endnote, DataCite, NLM, DC, CFF

by Tobias A. de Jong , J. (Johannes) Jobst

This dataset contains a Low Energy Electron Microscopy dataset consisting of raw data of both a dark field and a bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide. Additionally it contains calibration data: a dark count dataset, a HDR calibration dataset and two curves showcasing the difference between HDR and non-HDR imaging.

• 2019-11-25 first online, published, posted

4TU.Centre for Research Data

media types: application/x-netcdf, text/markdown

• https://arxiv.org/abs/1907.13510
• https://doi.org/10.1016/j.ultramic.2019.112913
• https://doi.org/10.5281/zenodo.3539538

• NWO, 680-47-447 (VENI)
• NWO, Frontiers of Nanoscience program

Lehrstuhl für Angewandte Physik, Universität Erlangen-Nürnberg;
Leiden Institute of Physics, Leiden University

• Hesselberth, M.B.S. (Marcel)
• Ott, C. (Christian)
• Scholma, D. (Douwe)
• Tromp, R.M. (Ruud)
• Van der Molen, S.J. (Sense Jan)