TY - DATA
T1 - Data underlying the paper: Quantitative analysis of spectroscopic Low Energy Electron Microscopy Data
PY - 2019/11/25
AU - Tobias A. de Jong
AU - J. (Johannes) Jobst
UR - https://data.4tu.nl/articles/dataset/Data_underlying_the_paper_Quantitative_analysis_of_spectroscopic_Low_Energy_Electron_Microscopy_Data/12705857/1
DO - 10.4121/uuid:7f672638-66f6-4ec3-a16c-34181cc45202
KW - Calibration data
KW - Electron Spectroscopy
KW - Graphene on Silicon Carbide
KW - LEEM-IV
KW - Low Energy Electron Microscopy
KW - Material Science
N2 - This dataset contains a Low Energy Electron Microscopy dataset consisting of raw data of both a dark field and a bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide. Additionally it contains calibration data: a dark count dataset, a HDR calibration dataset and two curves showcasing the difference between HDR and non-HDR imaging.
ER -