Data underlying the paper: Quantitative analysis of spectroscopic Low Energy Electron Microscopy Data

Datacite citation style:
de Jong, Tobias A.; Jobst, J. (Johannes) (2019): Data underlying the paper: Quantitative analysis of spectroscopic Low Energy Electron Microscopy Data. Version 1. 4TU.ResearchData. dataset. https://doi.org/10.4121/uuid:7f672638-66f6-4ec3-a16c-34181cc45202
Other citation styles (APA, Harvard, MLA, Vancouver, Chicago, IEEE) available at Datacite

Dataset

This dataset contains a Low Energy Electron Microscopy dataset consisting of raw data of both a dark field and a bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide. Additionally it contains calibration data: a dark count dataset, a HDR calibration dataset and two curves showcasing the difference between HDR and non-HDR imaging.

History

  • 2019-11-25 first online, published, posted

Publisher

4TU.Centre for Research Data

Format

media types: application/x-netcdf, text/markdown

Funding

  • NWO, 680-47-447 (VENI)
  • NWO, Frontiers of Nanoscience program

Organizations

Lehrstuhl für Angewandte Physik, Universität Erlangen-Nürnberg;
Leiden Institute of Physics, Leiden University

Contributors

  • Hesselberth, M.B.S. (Marcel)
  • Ott, C. (Christian)
  • Scholma, D. (Douwe)
  • Tromp, R.M. (Ruud)
  • Van der Molen, S.J. (Sense Jan) orcid logo

DATA

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