Data underlying the paper: Quantitative analysis of spectroscopic Low Energy Electron Microscopy Data
Datacite citation style:
de Jong, Tobias A.; Jobst, J. (Johannes) (2019): Data underlying the paper: Quantitative analysis of spectroscopic Low Energy Electron Microscopy Data. Version 1. 4TU.ResearchData. dataset. https://doi.org/10.4121/uuid:7f672638-66f6-4ec3-a16c-34181cc45202
Other citation styles (APA, Harvard, MLA, Vancouver, Chicago, IEEE) available at Datacite
Dataset
This dataset contains a Low Energy Electron Microscopy dataset consisting of raw data of both a dark field and a bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide. Additionally it contains calibration data: a dark count dataset, a HDR calibration dataset and two curves showcasing the difference between HDR and non-HDR imaging.
History
- 2019-11-25 first online, published, posted
Publisher
4TU.Centre for Research DataFormat
media types: application/x-netcdf, text/markdownReferences
Funding
- NWO, 680-47-447 (VENI)
- NWO, Frontiers of Nanoscience program
Organizations
Lehrstuhl für Angewandte Physik, Universität Erlangen-Nürnberg;Leiden Institute of Physics, Leiden University
DATA
OPeNDAP data service
Files (1)
- 4,515 bytesMD5:
2ca38ddc6f7d08d1b440c2dc1d062669
README.md -
download all files (zip)
4,515 bytes unzipped