%0 Generic
%A de Jong, Tobias A.
%A Jobst, J. (Johannes)
%D 2019
%T Data underlying the paper: Quantitative analysis of spectroscopic Low Energy Electron Microscopy Data
%U https://data.4tu.nl/articles/dataset/Data_underlying_the_paper_Quantitative_analysis_of_spectroscopic_Low_Energy_Electron_Microscopy_Data/12705857/1
%R 10.4121/uuid:7f672638-66f6-4ec3-a16c-34181cc45202
%K Calibration data
%K Electron Spectroscopy
%K Graphene on Silicon Carbide
%K LEEM-IV
%K Low Energy Electron Microscopy
%K Material Science
%X This dataset contains a Low Energy Electron Microscopy dataset consisting of raw data of both a dark field and a bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide. Additionally it contains calibration data: a dark count dataset, a HDR calibration dataset and two curves showcasing the difference between HDR and non-HDR imaging.
%I 4TU.Centre for Research Data