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Data underlying the paper: Quantitative analysis of spectroscopic Low Energy Electron Microscopy Data

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posted on 25.11.2019 by Tobias A. de Jong, J. (Johannes) Jobst
This dataset contains a Low Energy Electron Microscopy dataset consisting of raw data of both a dark field and a bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide. Additionally it contains calibration data: a dark count dataset, a HDR calibration dataset and two curves showcasing the difference between HDR and non-HDR imaging.

Funding

NWO, 680-47-447 (VENI)

NWO, Frontiers of Nanoscience program

History

Contributors

Hesselberth, M.B.S. (Marcel); Lehrstuhl für Angewandte Physik, Universität Erlangen-Nürnberg; Leiden Institute of Physics, Leiden University; Ott, C. (Christian); Scholma, D. (Douwe); Tromp, R.M. (Ruud); Van der Molen, S.J. (Sense Jan) [orcid:0000-0003-3181-2055]

Publisher

4TU.Centre for Research Data

Format

media types: application/x-netcdf, text/markdown

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