Data underlying the paper: Quantitative analysis of spectroscopic Low Energy Electron Microscopy Data
datasetposted on 25.11.2019, 00:00 authored by Tobias A. de JongTobias A. de Jong, J. (Johannes) Jobst
This dataset contains a Low Energy Electron Microscopy dataset consisting of raw data of both a dark field and a bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide. Additionally it contains calibration data: a dark count dataset, a HDR calibration dataset and two curves showcasing the difference between HDR and non-HDR imaging.