cff-version: 1.2.0
abstract: "This dataset contains a Low Energy Electron Microscopy dataset consisting of raw data of both a dark field and a bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide. Additionally it contains calibration data: a dark count dataset, a HDR calibration dataset and two curves showcasing the difference between HDR and non-HDR imaging."
authors:
  - family-names: de Jong
    given-names: Tobias A.
    orcid: "https://orcid.org/0000-0002-5211-8081"
  - family-names: Jobst
    given-names: J. (Johannes)
    orcid: "https://orcid.org/0000-0002-2422-1209"
title: "Data underlying the paper: Quantitative analysis of spectroscopic Low Energy Electron Microscopy Data"
keywords:
version: 1
identifiers:
  - type: doi
    value: 10.4121/uuid:7f672638-66f6-4ec3-a16c-34181cc45202
license: CC0
date-released: 2019-11-25