Data associated with the characterisation of MIM capacitors to investigate charge trapping and de-trapping

doi: 10.4121/ce52aef4-d777-411c-9136-5105d077d439.v1
The doi above is for this specific version of this dataset, which is currently the latest. Newer versions may be published in the future. For a link that will always point to the latest version, please use
doi: 10.4121/ce52aef4-d777-411c-9136-5105d077d439
Datacite citation style:
Marta Saccher (2024): Data associated with the characterisation of MIM capacitors to investigate charge trapping and de-trapping. Version 1. 4TU.ResearchData. dataset. https://doi.org/10.4121/ce52aef4-d777-411c-9136-5105d077d439.v1
Other citation styles (APA, Harvard, MLA, Vancouver, Chicago, IEEE) available at Datacite
Dataset

This dataset contains the data relative to the characterisation of MIM (Metal Insulator Metal) capacitors. Specifically, the dataset contains their charging and discharging processes measurements. The charging was characterised by measuring the current during with a voltage clamp experiment. Their discharging was characterised by measuring the current after the charging process, with the two electrodes short-circuited. A readme file is included with explanation of each folder content. Each folder includes also a readme file with explanation of the content.

history
  • 2024-03-28 first online, published, posted
publisher
4TU.ResearchData
format
.xlsx
funding
  • ECSEL JU, under grant agreement H2020-ECSEL-2019-IA-876190
organizations
TU Delft, Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Department of Microelectronics

DATA

files (3)