The DOI displayed above is for this specific version of this dataset, which is currently the latest. Newer versions may be published in the future. For a link that will always point to the latest version, please use
DOI: 10.4121/71ce3ba5-4336-4500-a284-51765b02710c

van Staveren, Job (2025): Data underlying the publication 'Cryo-CMOS Bias-Voltage Generation and Demultiplexing at mK Temperatures for Large-Scale Arrays of Quantum Devices'. Version 1. 4TU.ResearchData. dataset. https://doi.org/10.4121/71ce3ba5-4336-4500-a284-51765b02710c.v1

Categories

• Electrical and Electronic Engineering
• Engineering

Keywords

22-nm FinFET Chip-to-Chip Bonding Crossbar Cryo-CMOS Cryogenic Demultiplexing Digital-to-Analog Converter (DAC) Dilution Refrigerator Quantum Computing Scaling Single-Hole-Transistor (SHT)

Licence

CC BY 4.0

Interoperability

• RO-Crate Metadata

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by Job van Staveren

Data underlying the publication 'Cryo-CMOS Bias-Voltage Generation and Demultiplexing at mK Temperatures for Large-Scale Arrays of Quantum Devices'. The archive contains the underlying measurement datasets, as well as the scripts and processing required to generate the figures presented in the corresponding publication. The datasets contain measurements from sub-blocks of the system, as well as measurements from the full system.

History

• 2025-06-12 first online, published, posted

Publisher

4TU.ResearchData

Format

.mat, .m, .txt, .pdf

Funding

• NWO (grant code 16278) NWO
• Intel Corporation

Organizations

QuTech, Delft University of Technology
Department of Quantum and Computer Engineering (QCE), Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technology