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Totals for datasets (co-)authored by Jacob Hoogenboom
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Jacob Hoogenboom
Datasets
- Data underlying the publication: Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy
- Data underlying the publication: Integrated Array Tomography for 3D Correlative Light and Electron Microscopy
- Data underlying the publication: A cryogenic, coincident fluorescence, electron and ion beam microscope
- Data underlying the publication: Depth-dependent scaling of axial distances in light microscopy
- Microscopy data, code and analysis underlying the publication "Optical STEM detection for scanning electron microscopy"
