Usage statistics

Totals for datasets (co-)authored by Jacob Hoogenboom

Datasets

• Data underlying the publication: Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy
• Data underlying the publication: Integrated Array Tomography for 3D Correlative Light and Electron Microscopy
• Data underlying the publication: A cryogenic, coincident fluorescence, electron and ion beam microscope
• Data underlying the publication: Depth-dependent scaling of axial distances in light microscopy
• Microscopy data, code and analysis underlying the publication "Optical STEM detection for scanning electron microscopy"

Co-authors

Co-authors of Jacob Hoogenboom's datasets/collections. Bold: authors with a 4TU.ResearchData account.

• Abraham Koster
• Anouk Wolters
• Arent J. Kievits
• Arjen Jakobi
• B. H. Peter Duinkerken
• Ben Giepmans
• Ben N.G. Giepmans
• Caspar Jonker
• Cecilia de Agrela Pinto
• Daan Boltje
• Ernest van der Wee
• Grant Jensen
• Job Fermie
• Judith Klumperman
• Jürgen Plitzko
• Luc van Kessel
• Mart G. F. Last
• Max Kaag
• Myron Hensgens
• Nalan Liv
• Raunser, Stefan
• Roger Wepf
• Ryan Lane
• S. Elisa Chen
• Sander den Hoedt
• Sebastian Tacke
• Sergey Loginov
• Yoram Vos
• Zhexin Wang