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Totals for datasets (co-)authored by J. P. (Jacob) Hoogenboom
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J. P. (Jacob) Hoogenboom
Datasets
- Complex refractive index of ITO (Indium Tin Oxide) - ITO cover slides from Optics Balzers
- Data underlying the publication: Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy
- Data underlying the publication: Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping
- Subnanometer-accuracy optical distance ruler based on fluorescence quenching by transparent conductors
- Supplementary data that support the findings of "Information driven structured illumination microscopy using noise-controlled image reconstructions"