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Data underlying the paper: Intrinsic Stacking domains in graphene on silicon carbide: a pathway for intercalation

dataset
posted on 29.10.2018 by Tobias A. de Jong, J. (Johannes) Jobst, E. E. (Eugene) Krasovskii
This dataset contains a Low Energy Electron Microscopy (LEEM) bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide, two inequivalent dark field spectroscopic image series of the same region, a bright field time series of the same region during deintercalation of the intercalated hydrogen and ab initio calculated dark field spectra, as well as abstracted dark field spectra for bilayer and trilayer graphene for the same Dark Field geometry. The metadata of the measured datasets contains for each frame a time stamp, the pressure, the measured temperature, the electron landing energy and an overall multiplier for the intensity deduced from the variable detector gain. Further relevant methods are described in the corresponding paper.

Funding

DFG, SFB953

NWO, 680-47-447 (VENI)

NWO, Frontiers of Nanoscience program

Spanish Ministry of Economy and Competitiveness MINECO, FIS2016-76617-P

History

Contributors

Departamento de Física de Materiales, Universidad del País Vasco UPV/EHU, Leioa, Spain; Donostia International Physics Center (DIPC), San Sebastian, Spain; Hesselberth, M. B. S. (Marcel); IKERBASQUE, Basque Foundation for Science, Bilbao, Spain; Lehrstuhl für Angewandte Physik, Universität Erlangen-Nürnberg; Leiden Institute of Physics, Leiden University; Ott, C. (Christian); Scholma, D. (Douwe); Tromp, R. M. (Ruud); van der Molen, S.J. (Sense Jan) [orcid:0000-0003-3181-2055]

Publisher

4TU.Centre for Research Data

Format

media types: application/x-netcdf, application/zip, text/csv, text/markdown

Licence

Exports