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Data underlying the paper: Intrinsic Stacking domains in graphene on silicon carbide: a pathway for intercalation

posted on 29.10.2018 by Tobias A. de Jong, J. (Johannes) Jobst, E. E. (Eugene) Krasovskii
This dataset contains a Low Energy Electron Microscopy (LEEM) bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide, two inequivalent dark field spectroscopic image series of the same region, a bright field time series of the same region during deintercalation of the intercalated hydrogen and ab initio calculated dark field spectra, as well as abstracted dark field spectra for bilayer and trilayer graphene for the same Dark Field geometry. The metadata of the measured datasets contains for each frame a time stamp, the pressure, the measured temperature, the electron landing energy and an overall multiplier for the intensity deduced from the variable detector gain. Further relevant methods are described in the corresponding paper.



NWO, 680-47-447 (VENI)

NWO, Frontiers of Nanoscience program

Spanish Ministry of Economy and Competitiveness MINECO, FIS2016-76617-P



Departamento de Física de Materiales, Universidad del País Vasco UPV/EHU, Leioa, Spain; Donostia International Physics Center (DIPC), San Sebastian, Spain; Hesselberth, M. B. S. (Marcel); IKERBASQUE, Basque Foundation for Science, Bilbao, Spain; Lehrstuhl für Angewandte Physik, Universität Erlangen-Nürnberg; Leiden Institute of Physics, Leiden University; Ott, C. (Christian); Scholma, D. (Douwe); Tromp, R. M. (Ruud); van der Molen, S.J. (Sense Jan) [orcid:0000-0003-3181-2055]


4TU.Centre for Research Data


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