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Type #2
8Item with a doi
Creator
2Hoogenboom, J. P. (Jacob)
2Moerland, R. J. (Robert)
2Thorsen, R.Ø. (Rasmus)
1Blais, A.
1Brousse, D.
1Fazel, M. (Mohamadreza)
1Heydarian, H. (Hamidreza)
1Jungmann, R. (Ralf)
1Kalhor, N. (Nima)
1Lidke, K.A. (Keith)
1MSP/React. Flows and Explosions, Technical Physics Department, Delft University of Technology
1Mendes, U. C. (Udson)
1Rieger, B. (Bernd)
1Roekaerts, D.(Dirk)
1Samkharadze, N. (Nodar)
1Sammak, A. (Amir)
1Scappucci, G. (Giordano)
1Schueder, F. (Florian)
1Stallinga, S. (Sjoerd)
1Strauss, M.T. (Maximilian)
1Vandersypen, L.M.K. (Lieven)
1Zheng, G. (Guoji)
1Zhong, X. (Xiaopin)
1van Werkhoven, B. (Ben)
Year
42018
12017
22016
12010
Subject #2
2Nanotechnology
1Quantum Physics
Collection
8 General collection of datasets
Data format (mime type)
6text/plain
5application/zip
3application/x-matlab-data
2application/x-7z-compressed
1application/json
1application/x-rar-compressed
1image/tiff
1text/x-matlab
results 1-8
Saturated imaging of laser confocal microscopical imaging data of internal transparent microdefects of polarizersDataset2018Zhong, X. (Xiaopin)
Influence of optical aberrations on axial position determination by photometryDataset2018Thorsen, R.Ø. (Rasmus)
Single-Molecule Localization Microscopy (SMLM) 2D TU Delft logosDataset2018Heydarian, H. (Hamidreza); Schueder, F. (Florian); Strauss, M.T. (Maximilian); van Werkhoven, B. (Ben); Fazel, M. (Mohamadreza); Lidke, K.A. (Keith); Jungmann, R. (Ralf); Stallinga, S. (Sjoerd); Rieger, B. (Bernd)
Supplementary data to “Photon count estimation in single-molecule localization microscopy”Dataset2018Thorsen, R.Ø. (Rasmus)
Strong spin-photon coupling in siliconDataset2017Samkharadze, N. (Nodar); Zheng, G. (Guoji); Kalhor, N. (Nima); Brousse, D.; Sammak, A. (Amir); Mendes, U. C. (Udson); Blais, A.; Scappucci, G. (Giordano); Vandersypen, L.M.K. (Lieven)
Subnanometer-accuracy optical distance ruler based on fluorescence quenching by transparent conductorsDataset2016Moerland, R. J. (Robert); Hoogenboom, J. P. (Jacob)
Complex refractive index of ITO (Indium Tin Oxide) - ITO cover slides from Optics BalzersDataset2016Moerland, R. J. (Robert); Hoogenboom, J. P. (Jacob)
Laser Diagnostics Measurements in DELFT FLAME IIIDataset2010Roekaerts, D.(Dirk); MSP/React. Flows and Explosions, Technical Physics Department, Delft University of Technology