*** Radiationless anapole states in on-chip photonics *** 
Authors: E. Díaz-Escobar, T. Bauer, E. Pinilla-Cienfuegos, Á. I. Barreda, A. Griol, L. Kuipers, A. Martínez
Nanophotonics Technology Center, Universitat Politècnica de València, Camino de Vera s/n, 46022, Valencia, Spain;
Faculty of Applied Sciences, Department of Quantum Nanoscience, Kavli Institute of Nanoscience, Delft University of Technology, 2600 GA Delft, The Netherlands;
Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Str. 15, 07745 Jena, Germany
Corresponding authors: L. Kuipers, A. Martínez
Contact Information: l.kuipers@tudelft.nl, amartinez@ntc.upv.es

***General Introduction***
The dataset contains the primary numerical data used to construct the figures of the publication "Radiationless anapole states in on-chip photonics". Numerical simulation techniques using COMSOL Multiphysics, RSoft by Synopsis and Lumerical FDTD, as well as experimental measurements in far-field scattering setups and phase- and polarisation-resolved near-field scanning optical microscopy were utilised to generate the contained data.

The data file for each (sub)figure 1-6 in the manuscript as well as supplementary figure S1-S7 is provided in CSV format, with the column headers describing the data including units where necessary. The files are UTF-8 encoded.

The dataset is being made public to act as open data dissemination of the associated publication.

***Description of the data in this dataset***
The data included in this dataset has been organised per (sub)figure of the associated publication and supplementary materials (indicated by S in the file name). The files follow the nomenclature system: FigXy_Name and FigSXy_Name with
X = the figure number 1 to 6 of the main manuscript, and 1 to 7 of the supplementary
Y = indicating the subfigure part, if applicable.

***Headers of each file in the dataset***
Fig1b_Csca_normal.csv: wavelength in um, C_total in um**2, C_P in um**2, C_T in um**2, C_(P+T) in um**2, C_(M+TM) in um**2, C_(Qele+TQele) in um**2, C_(Qmag+TQmag) in um**2; where um corresponds to micrometer, C the scattering cross-section, and P, T, M, TM, Qele, Tele, Qmag and Tmag the Cartesian electric dipole, electric toroidal dipole, Cartesian magnetic dipole, magnetic toroidal dipole, electric quadrupole, electric toroidal quadrupole, magnetic quadrupole and magnetic toroidal quadrupole, respectively.
Fig1c_energy_normal.csv: wavelength in um, Energy in disk (norm.), Energy on disk (norm.), Maximum of abs(Ey)**2 (norm.); where um corresponds to micrometer, and Ey to the y-component of the electric field.
Fig1e_Csca_inplane.csv: wavelength in um, C_total in um**2, C_P in um**2, C_T in um**2, C_(P+T) in um**2, C_(M+TM) in um**2, C_(Qele+TQele) in um**2, C_(Qmag+TQmag) in um**2; where um corresponds to micrometer, C the scattering cross-section, and P, T, M, TM, Qele, Tele, Qmag and Tmag the Cartesian electric dipole, electric toroidal dipole, Cartesian magnetic dipole, magnetic toroidal dipole, electric quadrupole, electric toroidal quadrupole, magnetic quadrupole and magnetic toroidal quadrupole, respectively.
Fig1f_energy_inplane.csv: wavelength in um, Energy in disk (norm.), Energy on disk (norm.), Maximum of abs(Ey)**2 (norm.); where um corresponds to micrometer, and Ey to the y-component of the electric field.
Fig2a_anapolewvl_vs_diskradius.csv: radius in nm, Normal anapole wavelength in um, In-plane anapole wavelength in um, Waveguide anapole wavelength in um, Normal maximum energy wavelength in um, In-plane maximum energy wavelength in um; where nm corresponds to nanometer and um corresponds to micrometer.
Fig2b_wvldifference_vs_diskradius.csv: radius in nm, Normal wavelength difference in um, In-plane wavelength difference in um; where nm corresponds to nanometer and um corresponds to micrometer.
Fig2c_fieldampl_wvl1444.csv: x in um, y in um, abs(E)_inplane (norm.); where um corresponds to micrometer and abs(E)_inplane is the absolute value of the in-plane electric field at a wavelength of 1444 nm.
Fig2d_fieldampl_wvl1555.csv: x in um, y in um, abs(E)_inplane (norm.); where um corresponds to micrometer and abs(E)_inplane is the absolute value of the in-plane electric field at a wavelength of 1555 nm.
Fig2d_fieldampl_wvl1596.csv: x in um, y in um, abs(E)_inplane (norm.); where um corresponds to micrometer and abs(E)_inplane is the absolute value of the in-plane electric field at a wavelength of 1596 nm.
Fig3b_Ex_wvl1530.csv: x in um, y in um, Re(Ex) (norm.); where um corresponds to micrometer and Re(Ex) is the real part of the electric field component in x direction at a wavelength of 1530 nm.
Fig3b_Ey_wvl1530.csv: x in um, y in um, Re(Ey) (norm.); where um corresponds to micrometer and Re(Ey) is the real part of the electric field component in y direction at a wavelength of 1530 nm.
Fig3c_Ex_wvl1591.csv: x in um, y in um, Re(Ex) (norm.); where um corresponds to micrometer and Re(Ex) is the real part of the electric field component in x direction at a wavelength of 1591 nm.
Fig3c_Ey_wvl1591.csv: x in um, y in um, Re(Ey) (norm.); where um corresponds to micrometer and Re(Ey) is the real part of the electric field component in y direction at a wavelength of 1591 nm.
Fig3d_Csca_vs_diskradius.csv: wavelength in um, Csca in a.u. for disk radius 300 nm, Csca in a.u. for disk radius 310 nm, Csca in a.u. for disk radius 320 nm, Csca in a.u. for disk radius 325 nm, Csca in a.u. for disk radius 330 nm, Csca in a.u. for disk radius 340 nm, Csca in a.u. for disk radius 350 nm, Csca in a.u. for disk radius 360 nm, Csca in a.u. for disk radius 370 nm, Csca in a.u. for disk radius 375 nm, Csca in a.u. for disk radius 380 nm, Csca in a.u. for disk radius 390 nm, Csca in a.u. for disk radius 400 nm; where um corresponds to micrometer, nm corresponds to nanometer, and Csca to the scattering cross-section.
Fig3e_energy_vs_diskradius.csv: wavelength in um, abs(Ey)**2 in a.u. for disk radius 300 nm, abs(Ey)**2 in a.u. for disk radius 310 nm, abs(Ey)**2 in a.u. for disk radius 320 nm, abs(Ey)**2 in a.u. for disk radius 325 nm, abs(Ey)**2 in a.u. for disk radius 330 nm, abs(Ey)**2 in a.u. for disk radius 340 nm, abs(Ey)**2 in a.u. for disk radius 350 nm, abs(Ey)**2 in a.u. for disk radius 360 nm, abs(Ey)**2 in a.u. for disk radius 370 nm, abs(Ey)**2 in a.u. for disk radius 375 nm, abs(Ey)**2 in a.u. for disk radius 380 nm, abs(Ey)**2 in a.u. for disk radius 390 nm, abs(Ey)**2 in a.u. for disk radius 400 nm; where um corresponds to micrometer, nm corresponds to nanometer, and abs(Ey)**2 to the absolute squared of the electric field component in y direction.
Fig4d_Csca_exp_farfield.csv: wavelength in um, Normalized scattering disk r=325nm sample 1, Normalized scattering disk r=325nm sample 2, Normalized scattering disk r=350nm sample 1, Normalized scattering disk r=350nm sample 2, Normalized scattering disk r=375nm sample 1, Normalized scattering disk r=375nm sample 2; where um corresponds to micrometer and nm corresponds to nanometer.
Fig5bc-6a_Lx_wvl1486.csv: x in um, y in um, Lx (norm.); where um corresponds to micrometer, and Lx to the detected complex field in x direction at a wavelength of 1486 nm.
Fig5bc-6a_Ly_wvl1486.csv: x in um, y in um, Ly (norm.); where um corresponds to micrometer, and Ly to the detected complex field in y direction at a wavelength of 1486 nm.
Fig5bc-6a_Lx_wvl1526.csv: x in um, y in um, Lx (norm.); where um corresponds to micrometer, and Lx to the detected complex field in x direction at a wavelength of 1526 nm.
Fig5bc-6a_Ly_wvl1526.csv: x in um, y in um, Ly (norm.); where um corresponds to micrometer, and Ly to the detected complex field in y direction at a wavelength of 1526 nm.
Fig5bc-6a_Lx_wvl1566.csv: x in um, y in um, Lx (norm.); where um corresponds to micrometer, and Lx to the detected complex field in x direction at a wavelength of 1566 nm.
Fig5bc-6a_Ly_wvl1566.csv: x in um, y in um, Ly (norm.); where um corresponds to micrometer, and Ly to the detected complex field in y direction at a wavelength of 1566 nm.
Fig5bc-6a_Lx_wvl1606.csv: x in um, y in um, Lx (norm.); where um corresponds to micrometer, and Lx to the detected complex field in x direction at a wavelength of 1606 nm.
Fig5bc-6a_Ly_wvl1606.csv: x in um, y in um, Ly (norm.); where um corresponds to micrometer, and Ly to the detected complex field in y direction at a wavelength of 1606 nm.
Fig5bc-6a_Lx_wvl1640.csv: x in um, y in um, Lx (norm.); where um corresponds to micrometer, and Lx to the detected complex field in x direction at a wavelength of 1640 nm.
Fig5bc-6a_Ly_wvl1640.csv: x in um, y in um, Ly (norm.); where um corresponds to micrometer, and Ly to the detected complex field in y direction at a wavelength of 1640 nm.
Fig6b_energy_on_disk.csv: wavelength in um, exp. field energy ratio on disk; where um corresponds to micrometer.
Fig6b_energy_z_height.csv: wavelength in mu, z = 30 nm, z = 60 nm, z = 90 nm, z = 120 nm; where mu corresponds to micrometer, and nm corresponds to nanometer.
FigS1_anapolewvl_vs_diskheight.csv: disk height in nm, Normal anapole wavelength in um, In-plane anapole wavelength in um, Normal maximum energy wavelength in um, In-plane maximum energy wavelength in um; where nm corresponds to nanometer, and um corresponds to micrometer.
FigS2_Csca_inplane.csv: wavelength in um, Csca backward in a.u., Csca forward in a.u., Csca lateral(E) in a.u., Csca lateral(H) in a.u., Csca total in a.u.; where um corresponds to micrometer, and Csca to the scattering cross-section for in-plane excitation.
FigS2_Csca_normal.csv: wavelength in um, Csca backward in a.u., Csca forward in a.u., Csca lateral(E) in a.u., Csca lateral(H) in a.u., Csca total in a.u.; where um corresponds to micrometer, and Csca to the scattering cross-section for normal excitation.
FigS4_Energy_air_substrate.csv: wavelength in um, Top scattering energy (norm.), Energy on disk (norm.), Energy in disk (norm.), Top scattering energy with substrate (norm.), Energy on disk with substrate (norm.), Energy in disk with substrate (norm.); where um corresponds to micrometer.
FigS7a_Lx_wvl1560.csv: x in um, y in um, Lx (norm.); where um corresponds to micrometer, and Lx to the calculated complex field in x direction at a wavelength of 1560 nm.
FigS7a_Lx_wvl1600.csv: x in um, y in um, Lx (norm.); where um corresponds to micrometer, and Lx to the calculated complex field in x direction at a wavelength of 1600 nm.
FigS7a_Lx_wvl1640.csv: x in um, y in um, Lx (norm.); where um corresponds to micrometer, and Lx to the calculated complex field in x direction at a wavelength of 1640 nm.
FigS7a_Lx_wvl1680.csv: x in um, y in um, Lx (norm.); where um corresponds to micrometer, and Lx to the calculated complex field in x direction at a wavelength of 1680 nm.
FigS7a_Lx_wvl1720.csv: x in um, y in um, Lx (norm.); where um corresponds to micrometer, and Lx to the calculated complex field in x direction at a wavelength of 1720 nm.
FigS7a_Ly_wvl1560.csv: x in um, y in um, Ly (norm.); where um corresponds to micrometer, and Ly to the calculated complex field in y direction at a wavelength of 1560 nm.
FigS7a_Ly_wvl1600.csv: x in um, y in um, Ly (norm.); where um corresponds to micrometer, and Ly to the calculated complex field in y direction at a wavelength of 1600 nm.
FigS7a_Ly_wvl1640.csv: x in um, y in um, Ly (norm.); where um corresponds to micrometer, and Ly to the calculated complex field in y direction at a wavelength of 1640 nm.
FigS7a_Ly_wvl1680.csv: x in um, y in um, Ly (norm.); where um corresponds to micrometer, and Ly to the calculated complex field in y direction at a wavelength of 1680 nm.
FigS7a_Ly_wvl1720.csv: x in um, y in um, Ly (norm.); where um corresponds to micrometer, and Ly to the calculated complex field in y direction at a wavelength of 1720 nm.
FigS7b_energy_z_height.csv: wavelength in um, z = 10 nm, z = 20 nm, z = 30 nm, z = 40 nm, z = 50 nm, z = 60 nm, z = 70 nm, z = 80 nm, z = 90 nm, z = 100 nm, z = 110 nm, z = 120 nm; where um corresponds to micrometer and nm corresponds to nanometer.
FigS7c_max_energy_z_height.csv: tip height z in nm, wavelength maximum of field energy in um; where nm corresponds to nanometer and um corresponds to micrometer.
FigS8_waveguide_dispersion.csv: kx in 1/um, wavelength in um, abs(Fou_x(E))^2 (norm.); where um corresponds to micrometer, and Fou_x(E) to the Fourier-transform of the electric field along the x direction.