*** The formation of metallic domains by Anderson-Mott insulator-to-metal transition in photochromic yttrium oxyhydride films studied by in-situ spectroscopic ellipsometry *** 
Authors: Ziying Wu, Melanie Beek, Giorgio Colombi, Yilong Zhou, Diana Chaykina, Herman Schreuders, Ekkes Brück, Bernard Dam, and Stephan W. H. Eijt
TU Delft, Faculty of Applied Sciences, Department of Radiation Science and Technology
TU Delft, Faculty of Applied Sciences, Department of Chemical Engineering
TU Delft, Faculty of Applied Sciences, Department of Electrical Engineering, Mathematics and Computer Science
Corresponding author: Z.Wu 
Contact Information:
Z.Wu-2@tudelft.nl
Delft University of Technology, Faculty of Applied Sciences, Department of Radiation Science and Technology
Buildingnumber 50
Mekelweg 15
2629 JB Delft
The Netherlands
***General Introduction***
This dataset contains data collected during spectroscopic ellipsometry and optical transmittance experiments at Delft University 
of Technology, as part of Ziying Wu's PhD Thesis project (2024): 

It is being made public both to act as supplementary data for publications and the PhD 
thesis of Ziying Wu and in order for other researchers to use this data in their own work.
The data in this data set were collected in the Fundamental Aspects of Materials and Energy group at Department of Radiation Science and Technology, 
the Materials for Energy Conversion and Storage group at Department of Chemical Engineering, and the Photovoltaic Materials and Devices group at Department 
of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology between February 2020 and August 2024.

This research project was financially supported by the Guangzhou Elite Project (GEP) and 
the Materials for Sustainability (Mat4Sus) research program, which is financed by the Netherlands Organization for Scientific Research (NWO).
***Purpose of this research and the key experimental methods used***
The purpose of these experiments was to investigate the time-dependent evolution of the optical parameters in photochromic yttrium oxyhydride 
thin films. In this study, spectroscopic ellipsometry and transmittance were used, and the corresponding raw and processing data are included in this dataset.
***Description of the data in this data set***
The data in this dataset includes high-resolution figures, and corresponding raw and processing data. The raw and processing data for all 
measurements can be found under the file "raw data_in-situ illumination ellipsometry" and "processing data_in-situ illumination ellipsometry". 
The fits of ellipsometry data were obtained using CompleteEASE software.
