TY - DATA
T1 - Data underlying the paper: Intrinsic Stacking domains in graphene on silicon carbide: a pathway for intercalation
PY - 2018/10/29
AU - Tobias A. de Jong
AU - J. (Johannes) Jobst
AU - E. E. (Eugene) Krasovskii
UR - https://data.4tu.nl/articles/dataset/Data_underlying_the_paper_Intrinsic_Stacking_domains_in_graphene_on_silicon_carbide_a_pathway_for_intercalation/12712247/1
DO - 10.4121/uuid:a7ff07f4-0ac8-4778-bec9-636532cfcfc1
KW - Domain walls
KW - LEEM-IV
KW - Low energy electron microscopy
KW - Material Science
KW - Material science
KW - Van der Waals materials
KW - electron spectroscopy
KW - graphene on silicon carbide
N2 - This dataset contains a Low Energy Electron Microscopy (LEEM) bright field spectroscopic image series of a region of few layer graphene on Silicon Carbide, two inequivalent dark field spectroscopic image series of the same region, a bright field time series of the same region during deintercalation of the intercalated hydrogen and ab initio calculated dark field spectra, as well as abstracted dark field spectra for bilayer and trilayer graphene for the same Dark Field geometry. 
The metadata of the measured datasets contains for each frame a time stamp, the pressure, the measured temperature, the electron landing energy and an overall multiplier for the intensity deduced from the variable detector gain. Further relevant methods are described in the corresponding paper.
ER -