TY - DATA
T1 - Data underlying: Stacking domain morphology in epitaxial graphene on silicon carbide
PY - 2023/03/10
AU - Sense Jan van der Molen
AU - Tobias A. de Jong
AU - J. (Johannes) Jobst
UR - https://data.4tu.nl/articles/dataset/Data_underlying_Stacking_domain_morphology_in_epitaxial_graphene_on_silicon_carbide/21930768/1
DO - 10.4121/21930768.v1
KW - Low-energy electron microscopy (LEEM)
KW - graphene
KW - graphene on silicon carbide
KW - epitaxy
KW - domain walls
N2 - <p> This dataset contains stitched AC-LEEM overviews visualizing stacking domain boundaries in three different, high-quality graphene on SiC samples, grown in three different manners. The samples exhibit domain boundaries with different morphology, as explored in the corresponding paper. More details on the files can be found in the README.</p>
ER -