TY - DATA T1 - Data underlying the publication "Check-probe spectroscopy of lifetime-limited emitters in bulk-grown silicon carbide" PY - 2024/10/29 AU - G.L. van de Stolpe AU - Laurens J. Feije AU - Sjoerd Loenen AU - Antariksha Das AU - Gerben Timmer AU - Tijmen de Jong AU - Tim H. Taminiau UR - DO - 10.4121/9d3f41e9-ddcd-4153-8508-2a9a9d5ea654.v1 KW - Solid-state defects KW - Optical coherence KW - Spectral diffusion KW - Quantum networks KW - Silicon carbide N2 -
Solid-state single-photon emitters provide a versatile platform for exploring quantum technologies such as optically connected quantum networks. A key challenge is to ensure optical coherence and spectral stability of the emitters. Here, we introduce a high-bandwidth `check-probe' scheme to quantitatively measure (laser-induced) spectral diffusion and ionisation rates, as well as homogeneous linewidths. We demonstrate these methods on single V2 centers in commercially available bulk-grown 4H-silicon carbide. Despite observing significant spectral diffusion under laser illumination (≳GHz/s), the optical transitions are narrow (∼35 MHz), and remain stable in the dark (≳1 s). Through Landau-Zener-Stückelberg interferometry, we determine the optical coherence to be near-lifetime limited (T2 = 16.4(4) ns), hinting at the potential for using bulk-grown materials for developing quantum technologies. These results advance our understanding of spectral diffusion of quantum emitters in semiconductor materials, and may have applications for studying charge dynamics across other platforms.
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