TY - DATA T1 - Microscopy data underlying the publication "Optical STEM detection for scanning electron microscopy" PY - 2023/10/16 AU - Arent J. Kievits AU - B. H. Peter Duinkerken AU - Job Fermie AU - Ryan Lane AU - Ben N.G. Giepmans AU - Jacob Hoogenboom UR - DO - 10.4121/9c98aee1-608e-4c71-8b89-dcb1e8eb3e5e.v1 KW - Scanning Electron Microscopy KW - Scanning Transmission Electron Microscopy KW - Electron Detection KW - Volume Electron Microscopy KW - Instrumentation Development N2 -

Raw microscopy data underlying the publication, structured per experiment (figure). The imaging setting that is varied in the experiments (exposure/dwell time, beam current, landing energy) is indicated by the folder or image name. The images may have a data bar indicating the relevant acquisition settings.


Data set structure:


General acquisition parameters

Pixel size = 1 nm (unless stated otherwise)

Beam current = 0.4nA (unless stated otherwise)

BSD, SE Landing energy = 1.5keV (typically)

OSTEM landing energy = 4keV (typically)

ADF-STEM landing energy = 25keV






ER -