TY - DATA
T1 - Data underlying the publication: Device-Aware Test for Ion Depletion Defects in RRAMs
PY - 2025/03/17
AU - Hanzhi Xun
UR - 
DO - 10.4121/30c4cc38-5844-41f2-bdef-8fa36b800ec5.v1
KW - RRAM test
KW - linear resistors
KW - device-aware defect model
KW - non-volatile memory, 3D stackability
KW - non-volatile memory
KW - 3D stackability
N2 - <p>The raw data of a defect-free RRAM I-V curve, which can be seen in Fig. 10 (a). The data set can help researcher to make an I-V curve or R-V curve of a HfO2 based RRAM device.</p>
ER -