TY - DATA
T1 - Raw data contained in paper "Multilayer precursors for  enhanced Sm2+ and Tm2+ in SiAlO thin films prepared by magnetron sputtering"
PY - 2021/07/08
AU - Giacomo Bizinoto Ferreira Bosco
AU - J.K. van den Biesen
AU - C. Boers
AU - G. Simone
AU - J. Kao
AU - F.D. Tichelaar
AU - B. Boshuizen
AU - E. van der Kolk
UR - https://data.4tu.nl/articles/dataset/Raw_data_contained_in_paper_Multilayer_precursors_for_enhanced_Sm2_and_Tm2_in_SiAlO_thin_films_prepared_by_magnetron_sputtering_/14798358/1
DO - 10.4121/14798358.v1
KW - Samarium
KW - Thulium
KW - Magnetron Sputtering
KW - Multilayered Thin Films
KW - SiAlON
N2 - The contents of this dataset concern raw data files and scripts used to generate the figures 2, 3, 5 – 12, described in the paper "Multilayer precursors for enhanced Sm<sup>2+</sup> and Tm<sup>2+</sup> in SiAlO thin films prepared by magnetron sputtering". In this research work, the high concentration of undesired Sm<sup>3+</sup> causes low absorption observed in SiAlO:Sm thin films prepared by magnetron sputtering. The article also proposes an alternative deposition process for obtaining Sm doped SiAlO layers with enhanced Sm<sup>2+</sup> absorption by incorporating Sm by multilayer thin-film precursors composed of metallic Sm and SiAlO layers. Finally, it communicates Tm<sup>2+</sup> PL and PLE data on SiAlO hosts. Each dataset and script needed to generate each figure are separated. The data was generated by UV-VIS transmittance, photoluminescence emission (PL) and excitation (PLE), and X-ray photoelectron spectroscopy (XPS) of the Sm's 3d<sup>5/2</sup> edge. The data collection methods are described in the experimental section of the paper. PL and PLE data are given in .nc files, the analyzed results given by XPS are collected in .xls files, and the transmittance data are given as text files.<br>
ER -