TY - DATA
T1 - Data supporting the doctoral thesis "Volume electron microscopy with 64 beams and optical transmission detection"
PY - 2024/12/19
AU - Arent J. Kievits
AU - J. P. (Jacob) Hoogenboom
UR - 
DO - 10.4121/01efed58-9427-478a-8687-50b35daf3d9c.v1
KW - Electron Detection
KW - Instrumentation Development
KW - Scanning Electron Microscopy
KW - Scanning Transmission Electron Microscopy
KW - Volume Electron Microscopy
KW - Artifacts
KW - Sample preparation
N2 - <p>This repository contains a data set supporting the doctoral thesis "Volume electron microscopy with 64 beams and optical transmission detection" by Arent J. KIevits (DOI to be added when thesis is published online). Briefly, this thesis covers the development, bench marking and implementation of a workflow for volume electron microscopy using a 64-beam scanning transmission electron microscope (FAST-EM).</p><p><br></p><p>The data contained in this repository pertains to chapter 2 and 5 of the dissertation. The data sets of chapter 3 and 4 have been published already and can be found elsewhere:</p><p><br></p><ul><li>Chapter 3: https://data.4tu.nl/datasets/9c98aee1-608e-4c71-8b89-dcb1e8eb3e5e</li><li>Chapter 4: https://data.4tu.nl/datasets/bf3f2b23-2328-4d81-a0f4-05fdb33117d7.</li></ul><p><br></p><p>Chapter 2 covers a literature review of methodological advances in the field of volume electron microscopy, and the data supports Figure 2.1 in the chapter. Chapter 5 provides a thorough description of image artifacts encountered when imaging with FAST-EM and provides suggestions how to mitigate or avoid them. The data is structured in the order of discussion in the chapter(s), the structure can be found in the README.</p><p><br></p><p><br></p>
ER -