%0 Generic
%A Jan van der Molen, Sense
%A de Jong, Tobias
%A Jobst, J. (Johannes)
%D 2023
%T Data underlying: Stacking domain morphology in epitaxial graphene on silicon carbide
%U https://data.4tu.nl/articles/dataset/Data_underlying_Stacking_domain_morphology_in_epitaxial_graphene_on_silicon_carbide/21930768/1
%R 10.4121/21930768.v1
%K Low-energy electron microscopy (LEEM)
%K graphene
%K graphene on silicon carbide
%K epitaxy
%K domain walls
%X <p> This dataset contains stitched AC-LEEM overviews visualizing stacking domain boundaries in three different, high-quality graphene on SiC samples, grown in three different manners. The samples exhibit domain boundaries with different morphology, as explored in the corresponding paper. More details on the files can be found in the README.</p>
%I 4TU.ResearchData