%0 Computer Program %A Kievits, Arent J. %A Duinkerken, B. H. Peter %A Fermie, Job %A Lane, Ryan %A Giepmans, Ben N.G. %A Hoogenboom, Jacob %D 2023 %T Microscopy data, code and analysis underlying the publication "Optical STEM detection for scanning electron microscopy" %U %R 10.4121/9c98aee1-608e-4c71-8b89-dcb1e8eb3e5e.v2 %K Scanning Electron Microscopy %K Scanning Transmission Electron Microscopy %K Electron Detection %K Volume Electron Microscopy %K Instrumentation Development %X

Raw microscopy data underlying the publication, structured per experiment (figure). The imaging setting that is varied in the experiments (exposure/dwell time, beam current, landing energy) is indicated by the folder or image name. The images may have a data bar indicating the relevant acquisition settings.


Data set structure:


General acquisition parameters

Pixel size = 1 nm (unless stated otherwise)

Beam current = 0.4nA (unless stated otherwise)

BSD, SE Landing energy = 1.5keV (typically)

OSTEM landing energy = 4keV (typically)

ADF-STEM landing energy = 25keV






%I 4TU.ResearchData