Data for the paper "Model-based aberration corrected microscopy inside a glass tube".
Microscope objectives achieve near diffraction-limited performance only when used under the conditions they are designed for. In non-standard geometries, such as thick cover slips or curved surfaces, severe aberrations arise, inevitably impairing high-resolution imaging. Correcting such large aberrations using standard adaptive optics can be challenging: existing solutions are either not suited for strong aberrations, or require extensive feedback measurements, consequently taking a significant portion of the photon budget. We demonstrate that it is possible to pre-compute the corrections needed for high-resolution imaging inside a glass tube based on a priori information only. Our ray-tracing based method achieved over an order of magnitude increase in image contrast without the need for a feedback signal.
Contents:
1. 3-D 2PEF scans of fluorescent beads inside a glass tube.
2. Brightfield microscopy images of the glass tube.
3. Parameter scans of the phase correction patterns.
4. Sensorless AO scans (Zernike mode scans).
5. Ray-traced model-based phase correction patterns for glass tube.
6. Code to recreate figures from the paper from raw data.
7. Protocol to create tube samples.
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