cff-version: 1.2.0
abstract: "<p>Data underlying the publication: Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS.</p><p><br></p><p>The data concerns cryogenic low-frequency noise characterization of CMOS transistors. A wide range of geometries and bias points are swept. Details on how the data was recorded are found in the associated paper and its supplementary. For using the data, please refer to the "README.txt" file that is part of the data.</p>"
authors:
  - family-names: Kiene
    given-names: Gerd
    orcid: "https://orcid.org/0000-0002-2924-2033"
  - family-names: Ilik
    given-names: Sadik
    orcid: "https://orcid.org/0000-0002-5647-7188"
  - family-names: Mastrodomenico
    given-names: Luigi
    orcid: "https://orcid.org/0009-0002-5897-7423"
  - family-names: Babaie
    given-names: Masoud
  - family-names: Sebastiano
    given-names: Fabio
title: "Data underlying the publication: Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS"
keywords:
version: 1
identifiers:
  - type: doi
    value: 10.4121/c41c26f7-586f-48ca-8abe-9127b2d97c60.v1
license: CC0
date-released: 2024-08-01