cff-version: 1.2.0
abstract: "<p> This dataset contains stitched AC-LEEM overviews visualizing stacking domain boundaries in three different, high-quality graphene on SiC samples, grown in three different manners. The samples exhibit domain boundaries with different morphology, as explored in the corresponding paper. More details on the files can be found in the README.</p>"
authors:
  - family-names: Jan van der Molen
    given-names: Sense
    orcid: "https://orcid.org/0000-0003-3181-2055"
  - family-names: de Jong
    given-names: Tobias
    orcid: "https://orcid.org/0000-0002-5211-8081"
  - family-names: Jobst
    given-names: J. (Johannes)
    orcid: "https://orcid.org/0000-0002-2422-1209"
title: "Data underlying: Stacking domain morphology in epitaxial graphene on silicon carbide"
keywords:
version: 1
identifiers:
  - type: doi
    value: 10.4121/21930768.v1
license: CC BY 4.0
date-released: 2023-03-10