cff-version: 1.2.0 abstract: "

Raw microscopy data underlying the publication, structured per experiment (figure). The imaging setting that is varied in the experiments (exposure/dwell time, beam current, landing energy) is indicated by the folder or image name. The images may have a data bar indicating the relevant acquisition settings.


Data set structure:


General acquisition parameters

Pixel size = 1 nm (unless stated otherwise)

Beam current = 0.4nA (unless stated otherwise)

BSD, SE Landing energy = 1.5keV (typically)

OSTEM landing energy = 4keV (typically)

ADF-STEM landing energy = 25keV






" authors: - family-names: Kievits given-names: Arent J. orcid: "https://orcid.org/0000-0003-4457-9627" - family-names: Duinkerken given-names: B. H. Peter orcid: "https://orcid.org/0000-0003-0699-0001" - family-names: Fermie given-names: Job orcid: "https://orcid.org/0000-0002-7340-0377" - family-names: Lane given-names: Ryan orcid: "https://orcid.org/0000-0002-5887-2069" - family-names: Giepmans given-names: Ben N.G. orcid: "https://orcid.org/0000-0001-5105-5915" - family-names: Hoogenboom given-names: Jacob orcid: "https://orcid.org/0000-0003-4539-8772" title: "Microscopy data underlying the publication "Optical STEM detection for scanning electron microscopy"" keywords: version: 1 identifiers: - type: doi value: 10.4121/9c98aee1-608e-4c71-8b89-dcb1e8eb3e5e.v1 license: CC BY 4.0 date-released: 2023-10-16