cff-version: 1.2.0
abstract: "<p>Data underlying the PhD dissertation "Advanced Measurement Techniques for VNA Accuracy and Sensitivity Enhancement"</p><p><br></p><p>The data includes S-parameter measurement results acquired for calibration and uncertainty evaluation in connectorized and on-wafer systems. Furthermore, a collection of scripts (Matlab-based) is included for the evaluation and analysis of the measurement data.</p><p><br></p>"
authors:
  - family-names: Mubarak
    given-names: Faisal Ali
    orcid: "https://orcid.org/0000-0003-4774-9038"
title: "Data underlying the PhD dissertation &#34;Advanced Measurement Techniques for VNA Accuracy and Sensitivity Enhancement&#34;"
keywords:
version: 1
identifiers:
  - type: doi
    value: 10.4121/6a523997-cd55-4700-b472-7d69783e4ef2.v1
license: CC0
date-released: 2024-09-05