cff-version: 1.2.0
abstract: "<p>The raw data of a defect-free RRAM I-V curve, which can be seen in Fig. 10 (a). The data set can help researcher to make an I-V curve or R-V curve of a HfO2 based RRAM device.</p>"
authors:
  - family-names: Xun
    given-names: Hanzhi
    orcid: "https://orcid.org/0009-0000-5555-595X"
title: "Data underlying the publication: Device-Aware Test for Ion Depletion Defects in RRAMs"
keywords:
version: 1
identifiers:
  - type: doi
    value: 10.4121/30c4cc38-5844-41f2-bdef-8fa36b800ec5.v1
license: CC BY-NC-ND 4.0
date-released: 2025-03-17