@misc{https://doi.org/10.4121/uuid:a7ff07f4-0ac8-4778-bec9-636532cfcfc1,
  doi = {10.4121/uuid:a7ff07f4-0ac8-4778-bec9-636532cfcfc1},
  url = {https://data.4tu.nl/articles/dataset/Data_underlying_the_paper_Intrinsic_Stacking_domains_in_graphene_on_silicon_carbide_a_pathway_for_intercalation/12712247/1},
  author = {de Jong, Tobias A. and Jobst, J. (Johannes) and Krasovskii, E. E. (Eugene)},
  keywords = {Domain walls, LEEM-IV, Low energy electron microscopy, Material Science, Material science, Van der Waals materials, electron spectroscopy, graphene on silicon carbide},
  title = {Data underlying the paper: Intrinsic Stacking domains in graphene on silicon carbide: a pathway for intercalation},
  publisher = {4TU.Centre for Research Data},
  year = {2018},
  copyright = {CC0},
}