@misc{https://doi.org/10.4121/12764912.v1,
  doi = {10.4121/12764912.v1},
  url = {https://data.4tu.nl/articles/dataset/Data_to_Phase-locked_ultrafast_electron_microscopy_manuscript/12764912},
  author = {Garming, Mathijs and Bolhuis, Maarten and Conesa-Boj, Sonia and Kruit, Pieter and Hoogenboom, J. P. (Jacob)},
  keywords = {Condensed Matter Physics, Nanotechnology, Optical Physics},
  title = {Data underlying the publication: Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping},
  publisher = {4TU.ResearchData},
  year = {2024},
  copyright = {CC BY 4.0},
}