@misc{https://doi.org/10.4121/21930768.v1,
  doi = {10.4121/21930768.v1},
  url = {https://data.4tu.nl/articles/dataset/Data_underlying_Stacking_domain_morphology_in_epitaxial_graphene_on_silicon_carbide/21930768/1},
  author = {Jan van der Molen, Sense and de Jong, Tobias and Jobst, J. (Johannes)},
  keywords = {Low-energy electron microscopy (LEEM), graphene, graphene on silicon carbide, epitaxy, domain walls},
  title = {Data underlying: Stacking domain morphology in epitaxial graphene on silicon carbide},
  publisher = {4TU.ResearchData},
  year = {2023},
  copyright = {CC BY 4.0},
}