@misc{https://doi.org/10.4121/9c98aee1-608e-4c71-8b89-dcb1e8eb3e5e.v2,
  doi = {10.4121/9c98aee1-608e-4c71-8b89-dcb1e8eb3e5e.v2},
  url = {},
  author = {Kievits, Arent J. and Duinkerken, B. H. Peter and Fermie, Job  and Lane, Ryan and Giepmans, Ben N.G. and Hoogenboom, Jacob},
  keywords = {Scanning Electron Microscopy, Scanning Transmission Electron Microscopy, Electron Detection, Volume Electron Microscopy, Instrumentation Development},
  title = {Microscopy data, code and analysis underlying the publication "Optical STEM detection for scanning electron microscopy"},
  publisher = {4TU.ResearchData},
  year = {2023},
  copyright = {CC BY 4.0},
}