@misc{https://doi.org/10.4121/20787274.v1,
  doi = {10.4121/20787274.v1},
  url = {https://data.4tu.nl/articles/dataset/Data_underlying_the_publication_A_cryogenic_coincident_fluorescence_electron_and_ion_beam_microscope/20787274/1},
  author = {Boltje, Daan and Hoogenboom, Jacob and Jakobi, Arjen and Jensen, Grant and Jonker, Caspar and Kaag, Max and Koster, Abraham and Last, Mart G.
F. and de Agrela Pinto, Cecilia and Plitzko, Jürgen},
  keywords = {Cryo-electron tomography, Coincident fluorescence, electron and ion beam microscopy, Fluoresence targeted milling, FIB SEM, Fluorescence microscopy, Correlative microscopy},
  title = {Data underlying the publication: A cryogenic, coincident fluorescence, electron and ion beam microscope},
  publisher = {4TU.ResearchData},
  year = {2022},
  copyright = {CC BY 4.0},
}