@misc{https://doi.org/10.4121/uuid:25d6eef5-c427-42b5-ab38-5e512cca08a9,
  doi = {10.4121/uuid:25d6eef5-c427-42b5-ab38-5e512cca08a9},
  url = {https://data.4tu.nl/articles/dataset/Testing_Representational_Biases/12683159/1},
  author = {van der Aalst, Wil},
  keywords = {Event Logs, IEEE Task Force on Process Mining, Process Mining, Representational Biases, Testing, synthetic event logs},
  title = {Testing Representational Biases},
  publisher = {Eindhoven University of Technology},
  year = {2017},
  copyright = {4TU General Terms of Use},
}