Video recording associated with the publication: The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices

doi: 10.4121/16635193.v1
The doi above is for this specific version of this dataset, which is currently the latest. Newer versions may be published in the future. For a link that will always point to the latest version, please use
doi: 10.4121/16635193
Datacite citation style:
Marta Saccher; Kawasaki, Shinnosuke; Ronald Dekker (2021): Video recording associated with the publication: The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices. Version 1. 4TU.ResearchData. dataset. https://doi.org/10.4121/16635193.v1
Other citation styles (APA, Harvard, MLA, Vancouver, Chicago, IEEE) available at Datacite
Dataset
This dataset contains the video recordings associated with the publication. In the video, one CMUT element is exernally biased with a DC bias source, which is swept between 0 and 130 V and vice-versa. It can be seen that CMUTs go into collapse when the external DC bias voltage is higher than the collapse voltage (multiple rings of interference pattern appears at CMUTs cells, indicating a larger deflection profile). It can also be seen that not all the CMUT cells go into collapse and out-of-collapse at the same time.
history
  • 2021-09-22 first online, published, posted
publisher
4TU.ResearchData
format
.mp4
funding
  • ECSEL JU, under grant agreement H2020-ECSEL-2019-IA-876190
organizations
TU Delft, Faculty of Electrical Engineering, Mathematics and Computer Science, Department of Microelectronics

DATA

files (1)